HW 8 - RAM and Static Storage Elements, Dynamic Storage Elements
14: RAM and Static Storage Elements
3
a
We know that:
So then:
b
Do the same thing:
4
Since half the bits are the only thing that have power loss when restored, we have 1-Gbit which is
44
Consider the logic functions for:
Here our inputs are 01 ports respectively:
- If we 00, then
and retain whatever state they were in previously. - If we 01, then
is set to high, so is set to low (reset input) - If we 10, then
is set to high, so is set to low (set input) - If we 11, then we have an unstable state.
Hence this is just a standard RS-Flip Flop. Here the 0 port acts as a set, and 1 acts as a reset.
45
Consider:
Here, we want an RS-Flip Flop.
Regenerative switching of the cell will take place when the voltage at Q is pulled low enough
by transistor M R that the voltage at Q rises above the NMOS transistor threshold voltage.
Equating drain currents for this condition yields the value of VQ . It appears that
the NMOS transistor will be in the linear region, and the PMOS transistor will be saturated.
For VDD = 5V, 4x10−5
2
4
1
5 − VQ − 0.7( )2
= 10−4 2
1
VQ − 0.7 − 0.7
2
0.7 → VQ = 2.64V which agrees with
the assumptions. Now, M R must be large enough to force VQ = 2.64V. M R and the PMOS
load transistor are both in the linear region.
4x10−5 4
1
5 − 0.7 − 0.7 − 2.36
2
2.36 ≤ 10−4 W
L
R
5 − 0.7 − 2.64
2
2.64 → W
L
R
≥ 1.16
1
15: Dynamic Storage Elements
9
Consider:
Here we have a
a
For a bit of 0, here, the right side acts as a drain, so
Hence
For a bit of 1, here, the left side acts as the drain, so
which is our high bit voltage.
b
What
Thus:
So then:
12
Assume that
So then:
So then:
so then:
If a 128Mb memory is refreshed every 5ms:
15
Consider:
When we have logic 1, then
For logic 0, we have
If instead we have